• Ãâ·Â Á¦¾î ä³Î¼ö : 1 ~ 16 • ÁÖÆļö ¹üÀ§ : DC to 80 kHz
• »ùÇøµ ¼Óµµ : Up to 216 kHz • ÃÖ´ë Àåºñ °áÇÕ¼ö : 8
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- Sine test, Resonance Search and Tracking Dwell
- Random test
- Shock
- SRS
- TTH
- Sine on Random, Random on Random,
Sine and Random on Random,
Sine on Sine
- Transient Capture
- Field data recording and replication
- Fatigue tes